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X-RAY DIFFRACTION SERVICE

General

The School of Physics provides an X-ray diffraction analytical service to students and research staff requiring chemical analysis for teaching or research projects.

This service is extended to other schools and deparments within the university, other universities, government departments and commercial companies. A Professional Officer is available to operate or advise on the operation of the X-Ray equipment.


For further information contact:

Rod Mackie Mr Rod Mackie
Deputy Radiation Safety Officer
Tel: (03) 9905 3601
Fax: (03) 9905 3637
Email: Rod.Mackie@sci.monash.edu au

Current Techniques

  • Identification of Organic and Inorganic elements and compounds in solid or powder form.
  • Rietveld whole pattern fitting of powder patterns for quantitative analysis, crystallite size analysis and structure refinement.
  • Spectra pattern simulation.
  • Accurate measurement of lattice dimensions.
  • Rocking curve peak profile of single crystals and oriented powders.
  • Accurate single crystal alignment on the diffractometer prior to cutting and polishing.
  • Sample sedimentation, heat treatment and identification of Clay minerals
  • Low temperature (>10K<) phase analysis of powders
  • Residual Stress analysis on metals and metal composites.
  • Laue camera for single crystal analysis

Resources

The School is equipped with four computer automated diffractometers for chemical analysis and one table top generator for back reflection and single crystal work. A fourth generator, being set up for automated texture scanning is currently under way.

A Scintag high resolution diffractometer with state of the art software is employed in the laboratory for routine or high accuracy diffraction analysis. The Scintag has a solid state Ge detector, a scanning range from 2 deg to 160 deg with independent drives for theta, 2theta and phi axis. The I.C.D.D. data base with approximately 80,000 known Organic or Inorganic compounds is available on C.D. or Scintag software search match routines.

Two Philips vertical diffractometers are available to students and staff for ambient temperature and low temperature powder diffraction.The low temperature diffractometer incorporates an Oxford cryostat to house the specimen and requires liquid Helium to reduce the temperature to as low as 10K. The system is computer automated with state of the art data analysis software.

A diffractometer specifically built for post graduate research studies in Residual Stress analysis also caters for external contract work. The system is computer automated, employ's a H.T. solid state generator and data is collected using a position sensitive detector. Specific sample holders incorporate theta or theta and phi motions in the data collection routines. Post graduate studies are continuing on Aluminium, Silicon composites. External work is carried out on aircraft structures, ship structures, turbine blades and a variety of metal components from other research establishments and commercial companies.